A Behavioral Representation for Nyquist Rate A/D Converters

Edward Liu, Alberto L. Sangiovanni-Vincentelli, Georges Gielen, and Paul R. Gray Department of Electrical Engineering & Computer Sciences University of California Berkeley, California 94720 Abstract This paper presents a behavioral representation for the class of Nyquist rate A/D converters. The representation captures the nominal A/D behavior, as well as all the statistical variations. The variations are classi ed into noise and process variations according to how these non-idealities a ect the A/D behavior. To describe noise e ects we use a joint probability density function. To describe behavioral e ects due to process variations we use a variance-covariance matrix, t, which is a generalization of the integral nonlinearity vector. t's rank characterizes the testability of an A/D; its decomposition yields e cient strategies for A/D testing. Finally, parameter extraction results obtained from prototypes are presented.